Scintag X'TRA: new X-ray diffraction system

ARl Applied Research Laboratories announce their new XRD system, the Scintag X'TRA. The Scintag X'TRA offers solution for high-quality powder diffraction applications in the areas of academic research, chemicals, pharmaceuticals, polymers, semiconductors, thin ®lms, metals and minerals. Built around a vertical ± goniometer, this instrument offers convenient geometry for handling powder samples by facilitating the sample preparation, sample changer options and the use of specialized sample holders. In order to optimize experimental conditions, the goniometer features removable dual Soller slits and continuous variable micrometer-controlled slits for adjusting the width of both the incident and diffracted beams. The X-ray optics on the Scintag X'TRA goniometer ensure high resolution in the low-angle regions where peaks can be observed down to 0.5 . The system's modular con®guration allows the use of various sample stages to ful®ll a wide range of different applications. The Scintag X'TRA can also be equipped with the Scintag peltier cooled Si(Li) solidstate detector, tuned for high count rate in order to maximize coincidence loss. Thanks to the high resolution compared with a scintillation detector, it removes K and ̄uorescence radiation, thus eliminating the need for ®lters and monochromators. Consequently, the diffraction peak intensities are substantially higher than for other available con®gurations. System control for the Scintag X'TRA comes from the DMSNT software running under Windows NT as a true multitasking 32-bit data collection and analysis package. The analytical algorithms include: